ISSN: 2161-0398
+44 1478 350008
Zapparoli M
Department of Physics
CIGS, Centro Interdipartimentale Grandi Strumenti,
University of Modena and Reggio Emilia,
Italy
He has resarch interest in Material Characterization, SEM Analysis,TEM Image Analysis, EDX, SEM Operation, High Resolution Imaging and X-ray microanalysis.