PeakForce scanning electrochemical microscopy for nanoscale multi | 9740
Journal of Physical Chemistry & Biophysics

Journal of Physical Chemistry & Biophysics
Open Access

ISSN: 2161-0398

+44 1478 350008

PeakForce scanning electrochemical microscopy for nanoscale multimodal imaging: Topography, nanomechanics, nanoelectrics and electrochemistry

3rd International Conference on Electrochemistry

July 10-11, 2017 Berlin, Germany

Hartmut Stadler, Peter De Wolf, Samuel Lesko, Rakesh Poddar and Zhuangqun Huang

Bruker Nano Surfaces, USA

Posters & Accepted Abstracts: J Phys Chem Biophys

Abstract :

Studies of reactivity heterogeneity on the nanoscale require approaches capable of simultaneously capturing correlated multidimensional information. In situ, in vivo, non-invasive methodologies are also inevitable, e.g. for battery and biological research. Scanning electrochemical microscopy (SECM) is the only approach for studying local electrochemistry. Classic SECMs generally face challenges on the distance control between tip and sample (essential for obtaining accurate electrochemical information), low spatial resolving power (typically >�?¼m), and capture either only electrochemical information or only low-quality surface topography. SECM based on atomic force microscopy (AFM-SECM) can potentially overcome these issues. However, high-quality and high-consistency nanoelectrode AFM probes with a characteristic dimension <100 nm are not easily fabricable. Furthermore, classic contact mode is not suited for imaging highly soft and fragile samples (e.g. biological or energy materials). Tapping mode minimizes shear forces, but its mechanical resonance dependence poses difficulties for imaging in liquid or when ambient temperature varies. Recently, we have developed batch-fabricated, high-quality and robust SECM probes (exposed Pt tip with ~200 nm height and ~50 nm end diameter). Their robustness allows >10 h continuous electrochemical testing with an ease-of-use focus. Together with our recently developed PeakForce Tapping (PFT) mode, which features intermittent sample contact without shear forces, directly controlled imaging forces as low as <50 pN, and quantitative mechanical mappings at normal AFM scan rate, in situ, in vivo, non-invasive, stable imaging for challenging fragile and soft samples gets possible. High-quality SECM probes with PFT (PeakForce SECM) access multidimensional information in the electrochemical environment with <100 nm spatial resolution, including topographic, conductivity, mechanical, and electrochemical properties. This presentation showcases a variety of application examples using PeakForce SECM, including catalysis, surface defects on lamellar, patterned nanostructured electrodes, and nanoelectric measurements in liquid, demonstrating the versatility of PeakForce SECM for todayâ�?�?s highly-multidisciplinary research.

Biography :