ISSN: 2165- 7866
Department of Microsystems Engineering, University of Technology, Graz, Austria
 Commentary   
								
																Optical Inspection of Microelectronics Simulation using a Deep Learning  Framework and Product Designs 
																Author(s): Sergiu Saoutieff*             
								
								
																DOI:
								10.35248/2165-7866.23.13.339